Catalog

SPEC

Substrate

Size（mm）

Qty(pc)

window

wedge﹤6 mins arc

fringes measured@0.6328 microns

bevel edgesx45º

TO0.2 max face width AR8~14um

Ge

φ12.5x1.2

＞10

IR CaF2 window

clear aperture 85%, parallelism 3arc min

flatness 2waves@633nm

CaF2

φ12.7*1

＞10

Window

AR coating,

T > 50% @ 2.5 - 3.5µm

T > 93% @ 3.5 - 10µm

T > 75% @ 10 - 14µm

T > 50% @ 14 - 18µm

Ge

Φ(25.4±0.1)×(0.5±0.05)

2

Window

AR3.5-4.9

Ge

φ15*1

＞10

IR CaF2 window

/

CaF2

φ11*1

2

Window

AR(8~14)um

Ge

Φ25.4×1.0

5

 IR CaF2 window

/

CaF2

Φ50.8x5

0

Pixel Scale

0＂.075/ pix

IR CaF2 window

0＂.15,0＂.30,0＂.60

Wavelength Range

Resolving Power

Slit Power

Required Exposure

Echelle Orders

Cross-disperser

Orders

zJ(1.03—1.18um)

J(1.18—1.38um)

H(1.49—1.83um)

K(1.90—2.49um)

L(2.90—4.16um)

M(4.41—5.34um)

19,000-22,600

19,000-22,600

18,800-22900

18,300-23,600

17,300-25,100

16,800-26,300

3＂.8

3＂.8

5＂.6

7＂.3

10＂.0

10＂.0

1

1

2

2

6

4

56-48

47-42

38-32

29-23

19-14

12-11

6

5

4

3

2

1